ESC to present at IChemE’s Hazards30
ESC to present at IChemE’s Hazards30 this year with Dr Fan Ye’s ‘Deriving Spurious Trip Rate Formulae’ on Thursday 26th November 2020.
ESC to present at IChemE’s Hazards30
The Hazards is held annually in the UK and this year due to COVID restrictions it will be held virtually on 26 – 27 November 2020. The presentations will be delivered on a live timetable and will include a live Q&A.
Deriving Spurious Trip Rate Formulae
IEC 61511 (IEC, 2017) requires a spurious trip rate to be specified as part of the Safety Requirement Specification (SRS) for a Safety Instrumented Function (SIF).
However, safety engineers are often preoccupied with determining and verifying the Safety Integrity Level (SIL), Probability of Failure on Demand (PFD) for low demand SIF or Frequency of Failure per Hour (PFH) for high demand/continuous SIF, and are unfamiliar with the concept of spurious trip rate.
The issue is exacerbated by the fact that no formulae for calculating spurious trip rate are provided in the functional safety standards such as IEC 61508 (IEC, 2010) and IEC 61511 (IEC, 2017).
Dr Fan Ye’s presentation explains the concept of spurious trip and its importance in the design of a SIF deriving simplified formulae for calculating spurious trip rate for many common configurations such as 1 out of 1 (1oo1), 1oo2 and 2oo3, and a generalised formula that can be used for any M out of N (MooN) configuration.
Date: Thursday 26th November 2020
Time: 12:40 – 13:05 (UK Time)
Hazards30 Track 3- LOPA
Register now on IChemE’s website below.
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